Hall coefficient and resistivity of amorphous Ti1-xAlx films.

The resistivity of codeposited amorphous Til „Al films has been measured from 1.5 to 300 K over the composition range 0.4~x ~0.92, and the Hall coefficient has been measured at 4 K. The resistivity exhibits a relatively small temperature dependence. The magnitude of the room-temperature resistivity varies appreciably with composition, with a broad maximum around 250 pQ cm near x =0.5. The Hall coefficient is positive at x =0.4 and increases to a maximum at x =0.6. It becomes negative at x =0.85